Deep Learning for Sparse Scanning Electron Microscopy

Scanning ultrafast electron microscopy.

Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...

Flash Scanning Electron Microscopy

Scanning Electron Microscopy (SEM) is an invaluable tool for biologists and neuroscientists to study brain structure at the intracellular level. While able to image tissue samples with up to 5 nm isotropic resolution, image acquisition is prohibitively slow and limits the size of processed samples. In this work, we propose a novel approach to speeding up imaging when looking for specific struct...

Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations.

Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level precision. This progress has been accompanied by an exponential increase in the size and quality of data sets produced by microscopic and spectroscopic experimental ...

Scanning Transmission Electron Microscopy for Nanostructure Characterization

Scanning electron microscopy for materials characterization

Current materials are usually complex in chemistry, three-dimensional in form, and of rapidly diminishing microstructural scale. To characterize such materials the scanning electron microscope (SEM) now uses a wide range of operating conditions to target the desired sample volume, sophisticated modeling techniques to interpret the data. It also uses novel imaging modes to derive new types of in...